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High-Temperature
Tests for Graphite Composites on the Basis of Isotope 13C and Natural Graphite
to Forecast the Lifetime of a Neutron
Target |
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E.I.Zhmurikov, A.I.Romanenko, O.G.Abrosimov, O.V.Anikeeva, K.V.Gubin, P.V.Logachev,
Tecchio Luigi |
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Properties
of GaAs/InGaAs Quantum-Size Structures Containing δ<Mn>-Doped Layers |
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O.V.Vikhrova, Yu.A.Danilov, Yu.N.Drozdov, B.N.Zvonkov, F.Iikawa, M.J.S.P.Brasil |
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Structure of
Thin Al2O3 Layers Synthesized on Silicon Surface by
Atomic Layer Deposition Methods |
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S.V.Bukin, A.S.Shulakov |
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Account of
Focused Intensity Losses Channels for Refractive Optic Devices |
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L.G.Shabel’nikov |
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Experimental
Study of PDI Possibilities for the Control
of Optical Elements Form |
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A.Yu.Klimov,E.B.Klyuenkov, A.L.Mizinov,E.L.Pankratov, V.N.Polkovnikov, N.N.Salashenko, E.D.Chkhalo, N.I.Chkhalo, N.B.Voznesenskii |
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Intrinsic
Symmetry of Refracting Profiles Derived from Parabol |
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V.V.Aristov, L.G.Shabelnikov |
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Nonlinear
Properties of Two-Dimensional Semiconductor Superlattices
in Biharmonic Fields |
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Yu.Yu.Romanova,A.A.Ryzhova, Yu.A.Romanov, I.V.Keleinov |
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Study of Degradation
Mechanism of Ultrathin HfO2 Layers on
Silicon during Vacuum Annealing by Atomic Force Microscopy |
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A.S.Baturin, A.V.Zenkevich, Yu.Yu. Lebedinskii, N.Yu.Lubovin, V.N.Nevolin, E.P.Sheshin |
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Peculiarities
of Adhesion Properties of Films on Ion-Doped Device Structures |
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V.P.Astakhov, V.V.Karpov, V.V.Krapukhin, A.D.Maksimov, V.S.Tulovchikov, D.I.Tetelbaum |
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Absolutly
Calibrated Device for Measurement of EUV Power Suitable for Certification |
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of Radiation
Source in the 13.5 nm Range |
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I.G.Zabrodin,
B.A.Zakalov, S.Yu.Zuev, I.A.Kaskov, E.B.Klyuenkov,A.Ya.Lopatin,
N.N.Salashenko,L.A.Suslov, A.E.Pestov,
N.I.Chkhalo,L.A.Shmaenok |
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Polarization
Correction to the Energy Gap in Silicon Nanocrystals |
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V.A.Burdov |
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Ground State
of Electrons and Holes in a Silicon Quantum Dot with Shallow Donor |
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V.A.Belyakov, V.A.Burdov |
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Off-Plane
Grazing Incidence Blazed Grating with Radial Groove Geometry as an Efficient
Spectral Purity Filter for EUV Lithography |
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L.I.Gorai |
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Formation of
X-Ray Images by means of Thermal Action of Light Beam on the |
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Surface
during Diffraction |
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V.N.Trushin,
A.S.Markelov, E.V.Chuprunov,
A.A.Zholudev |
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Station
DICSI at KCSR and NT. The Definition of Optimal Requirements to Formation of
SR-Beam Using Cylindrical X-Ray Optical Zoom Tenses |
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V.N.Korneev, P.M.Sergienko, V.A.Shlektarev, V.M.Aul’chenko, V.A.Bukin, V.M.Titov, B.P.Tolochko, M.R.Sharafutdinov, A.V.Zabelin,
E.I.Litvinov,
A.M.Matyushin,
V.G.Stunkevich, M.A.Sheromov,
O.V.Naida, A.A.Vazina |
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Investigation
of Fuel Cladding Tube Zirconium Surface by AFM and TEM |
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T.M.Poletika, E.V.Yudina, S.L.Girsova, N.V.Girsova |
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Magnetic
Properties of the Multiwall Carbon Nanotubes and Astralenes in
High Level Electronic Fields |
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, A.N.Brozdnichenko, A.N.Ponomarev,
V.P.Pronin, V.V.Rybalko |
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Possibilities
and Prospects of Irradiated Constructional and Fuel Materials Investigation
with Application of Scanning Electron Microscope Philips XL 30 ESEM-TMP
Installed in the Hot Cell |
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V.N.Golovanov, A.E.Novoselov, S.V.Kuzmin, V.V.Yakovlev |
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Accounting
Lines Overlapping and Background Approximation in Energy Dispersive XRF and
Microprobe Analyses |
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A.T.Savichev, S.S.Stepanov |
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Features of
the Isotope Distribution Examination in Materials with High Sheet Resistance
Using Secondary Ion Mass Spectrometry Method |
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Yu.D.Goncharenko, L.A.Evseev |
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Intense
Radiation from a Relativistic Electron Rotating about a Dielectric Ball |
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M.L.Grigoryan |
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Electrodeposition
and Properties of Galvanic Coatings of Molybdenum (Tungsten) –Nickel (Cobalt) |
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V.V.Malyshev |
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Óòî÷íåíèå ïîëîæåíèÿ àòîìîâ âîäîðîäà â (NH4)2SeO4 |
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A.Loose, G.Melnyk, N.Zink, K.Wozniak, P.Dominiak, Ë.Ñ.Ñìèðíîâ, A.Pawlukoje, |
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½ Ë.À.Øóâàëîâ½ |