The sector of the elemental and structural analysis (laboratory) was founded on May 1, 2012.

The main goal the laboratory is an X-Ray methodic improvement of scientific researches to apply for development in the field of physics of the condensed state and materials science.

The X-ray diffraction analysis is one of nondestructive analytical methods. It found a broad application in condensed matter.
X-ray diffraction analysis includes:

• Determination of unit cell parameters for crystals
• Qualitative and quantitative X-ray phase analysis (powder samples)
• Structural analysis
• Phase transitions, etc.

The electron microscopy is intended for studying of microstructure of materials. This method allows to:

• define phase composition of material from picture analysis of electronic diffraction;
• define orientation ratios between phases;
• define crystallographic orientation and disorientation of grains;
• carry out characterization of defects of crystal structure (dislocation, packing defects, twins, borders of grains).

Scanning electron microscopy (SEM) is applied for characterization of structure of surfaces of material. The combination of scanning electron microscope with the detector of characteristic x-ray radiation allows to get information about structure of a sample. Ability of the method considerably extend with using two guns – electronic and ionic (Dual Beam VERSA 3D), wich allows to:

• modify a surface of samples;
• make high-quality samples for SEM;
• study of structure and composition of materials;
• make 3D reconstruction of sample structure.