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E.S.Tikhonov's publications

  1. E.S. Tikhonov, V.S. Khrapai, D.V. Shovkun, D. Schuh
    Finite-size effect in shot noise in hopping conduction
    JETP Letters 98 (2), 121-126 (2013)
    pdf (301.1 kB)
  2. E.S. Tikhonov, M.Yu. Melnikov, D.V. Shovkun, L. Sorba, G. Biasiol, and V.S. Khrapai Nonlinear transport and noise thermometry in quasiclassical ballistic point contacts
    Phys. Rev. B 90, 161405(R) (2014)
    pdf (320 kB)
  3. E.S. Tikhonov, D.V. Shovkun, V.S. Khrapai, Z.D. Kvon, N.N. Mikhailov, S.A. Dvoretsky
    Shot noise of the edge transport in the inverted band HgTe quantum wells In memory of V.F. Gantmakher
    JETP letters 101 (10), 787-792 (2015)
    pdf (329.2 kB)
  4. E.S. Tikhonov, D.V. Shovkun, D. Ercolani, F. Rossella, M. Rocci, L. Sorba, S. Roddaro, V.S. Khrapai
    Noise thermometry applied to thermoelectric measurements in InAs nanowires

    Semiconductor Science and Technology, 31, 10, 104001 (2016)
    pdf (1.517 mB)

  5. E.S. Tikhonov, D.V. Shovkun, D. Ercolani, F. Rossella, M. Rocci, L. Sorba, S. Roddaro, V.S. Khrapai

    Local noise in a diffusive conductor, Scientific Reports, 6, Article number: 30621 (2016)
    pdf (931.5 kB)

  6. E.S. Tikhonov, D.V. Shovkun, M. Snelder, M.P. Stehno, Y. Huang, M.S. Golden, A.A. Golubov, A. Brinkman, and V.S. Khrapai
    Andreev reflection in s-type superconductor proximized 3D topological insulator

    Phys. Rev. Lett, 117, 147001 (2016)

    pdf
  7. S.U. Piatrusha, V.S. Khrapai, Z.D. Kvon, N.N. Mikhailov, S.A. Dvoretsky, and E.S. Tikhonov

    Edge states in lateral p-n junctions in inverted-band HgTe quantum wells

    Phys. Rev. B 96, 245417 (2017)

    pdf
  8. Piatrusha S.U., Ginzburg L.V., Tikhonov E.S., Shovkun D.V., Koblmüller G., Bubis A.V., Grebenko A.K., Nasibulin A.G., Khrapai V.S.
    Noise insights into electronic transport
    JETP Letters 108 (1), 71-72 (2018)
    pdf (76 kB)
  9. Artem Denisov, Evgeny Tikhonov, Stanislau Piatrusha, Daniele Ercolani, Francesco Rossella, Mirko Rocci, Lucia Sorba, Stefano Roddaro, Vadim Khrapai

    Thermal biasing at the nanoscale

    arXiv:1812.06463

 

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