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The scientific-methodical work is an important component of the LSR work, which should satisfy the needs of employees of other laboratories of the ISSP RAS both in structure investigations and in interpretation of the obtained results. The methodical work includes the carrying out of investigations for employees of other laboratories by orders. It consists of measurements and determination of required characteristics of a specimen, like phase composition, single crystal orientation, dimension and form of structure components, chemical composition. These works are divided into the following groups:

X-ray works:

  Phase analysis of polycrystalline materials;
  Certification of single crystals, determination of single crystal orientation, preparation of oriented crystal cuts, determination of syngony, and calculation of lattice parameters using X-ray topographs of rocking;
  Operation with structure database;
  Full-profile analysis of X-ray spectra of powders.

Electron microscopic works:

  Putting of electron microscopes at someone disposal for self-working of advanced employees of other laboratories and their servicing;
  Carrying out of investigation orders by transmission and scanning electron microscopy;
  Determination of specimen composition by local X-ray spectral microanalysis.


The LSR has the following experimental equipment:
X-ray diffractometers: Siemens D-500, DRON-4, and DRON -2 with facilities to measure at high and low temperatures;
Single-crystal 4-circle diffractometer Enraf-Nonius CAD4;
Equipment for obtaining of X-ray topographs: a spectrometer based on an X-ray radiation D 4 C and a goniometer A -4 (Rigaku), a spectrometer based on an X-ray radiation RU -200 and a goniometer A -4 (Rigaku), and two-crystal spectrometer URT-2 (Russia);
Equipment for certification of specimens by the Debye, Lang, Laue, and Kossel methods;
Scanning electron microscopes JSM 25 S and Supra 50VP with facilities for energy-dispersion and wave microanalysis;
Transmission electron microscopes JEM-100CX JEM-100CX-11;
High-resolution electron microscope JEOL 4000 EX;
Equipment for preparation of electron-microscopic specimens: a device for sputtering of thin layers of different materials, ionic and electrolytic polishing of specimens;
Computer programs for processing of experimental data.


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